Design Approaches for SECDED ECC Architectures in Automotive Systems

  • Authors

    • VenkataKrishna Brahmam Pogadadanda Senior Silicon Design Engineer at AMD Xilinx, India. Author

    DOI:

    https://doi.org/10.67228/3071642X/IJCFDE-2022PII2S3A

    Published 09-04-2022

  • SECDED ECC, Automotive Systems, Error Correction Codes, Functional Safety, Memory Reliability, Fault-Tolerant Architectures, FPGA/ASIC Design, ISO 26262

    Issue

    Vol. 5 No. 2 (2022)

    Section

    Articles

  • Abstract

    With vehicles nowadays heavily relying on electronic control systems for their operation, securing the reliability and safety of automotive memory architectures has become a major design challenge. In fact, the different automotive features like Advanced Driver Assistance Systems (ADAS), autonomous driving platforms, engine control units, and in-vehicle infotainment do normally function in the very harsh vehicular environments where radiation-induced soft errors, noise, and hardware faults could disrupt their operability. Especially in safety-critical environments, a single bit error in the memory might not only affect the system's normal operation or reduce its performance but even cause a tragedy. The common response to the aforementioned problems is the use of fault-tolerant design techniques, and among these, the role of Single Error Correction and Double Error Detection (SECDED) Error Correction Code (ECC) structures in enhancing memory reliability and data integrity cannot be underrated. This paper showcases a variety of design techniques of SECDED ECC architectures for automotive systems, mainly concentrating on leveraging reliability, hardware complexity, latency, and power consumption. The paper discusses different encoding and decoding options, parity generation methods, syndrome computation techniques, and architectural improvements for automotive embedded memories. Conducted experiments continue to focus on fault coverage, as well as on the costs associated with the implementations and performances expected for automotive scenarios with stringent real-time requirements. Introduced solutions preserve compactness and high operating speed and at the same time, they improve error detection and correction abilities which make them more than suitable for next generation automotive electronics. The results further confirm that well-designed SECDED ECC structures do a great job in reinforcing system failure resilience and supporting the fulfillment of automotive safety standards such as ISO 26262. Basically, this study is a step towards the design of dependable and efficient memory protection mechanisms for reliable automotive computing systems.

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